Development of PSpice modeling platform for 10 kV/100 A SiC MOSFET power module

Joäo Pedro Rodrigues Martins, Muhammad Nawaz, Kalle Ilves , Francesco Iannuzzo

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

4 Citations (Scopus)

Abstract

This work deals with the implementation and development of a PSpice based modeling platform for 10 kV/100 A SiC MOSFET power modules. The studied SiC MOSFET power module is composed of a total of 9 dies connected in parallel with 10.0 kV blocking voltage capability. The proposed model was implemented based on the already established McNutt Hefner model originally developed for discrete single-die based SiC-MOSFETs. The proposed model has been verified both with static and dynamic experimental data and at different temperatures. Moreover, the energy loss assessment has been performed for a variety of operating parameters (e.g., stray inductance, gate resistance), different load current and supply voltages. The model was also verified with parallel connection of several power modules in order to predict the current unbalance as a result of various parasitic elements in the test circuit. The developed model has been further extended to study the electro-thermal behaviour under short circuit with accurate predictability, and validated with the experimental data. Finally, the operational robustness of the model was judged by simulating an arbitrary Buck, and Boost converter where the converter efficiency was studied with varying circuit parameters.
Original languageEnglish
Title of host publicationProceedings of 2017 IEEE Energy Conversion Congress and Exposition (ECCE)
PublisherIEEE Press
Publication dateOct 2017
ISBN (Electronic)978-1-5090-2998-3
DOIs
Publication statusPublished - Oct 2017
Event2017 IEEE Energy Conversion Congress and Exposition (ECCE) - Cincinnati, Ohio, United States
Duration: 1 Oct 20175 Oct 2017

Conference

Conference2017 IEEE Energy Conversion Congress and Exposition (ECCE)
Country/TerritoryUnited States
CityCincinnati, Ohio
Period01/10/201705/10/2017

Keywords

  • SiC-MOSFETs
  • Pspice Simulation
  • Device modeling
  • Parameter extraction
  • Wide bandgap devices

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