FEM-aided damage model calibration method for experimental results

Martin Bendix Fogsgaard; Francesco Iannuzzo

doi:10.1016/j.microrel.2020.113915

FEM-aided damage model calibration method for experimental results

Martin Bendix Fogsgaard, Francesco Iannuzzo

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Abstract

This paper presents a novel loading evaluation procedure to be used for IGBT power cycling. The method is a combination of experimental life tests and finite element analysis digital twin. It was validated and predicted the life-time with 2.77% error, compared to the 8.78% error of the reference.

Original language	English
Article number	113915
Journal	Microelectronics Reliability
Volume	114
ISSN	0026-2714
DOIs	https://doi.org/10.1016/j.microrel.2020.113915
Publication status	Published - Nov 2020

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@article{cb101df68a2741f4ad337afc15187947,

title = "FEM-aided damage model calibration method for experimental results",

abstract = "This paper presents a novel loading evaluation procedure to be used for IGBT power cycling. The method is a combination of experimental life tests and finite element analysis digital twin. It was validated and predicted the life-time with 2.77% error, compared to the 8.78% error of the reference.",

author = "Fogsgaard, {Martin Bendix} and Francesco Iannuzzo",

year = "2020",

month = nov,

doi = "10.1016/j.microrel.2020.113915",

language = "English",

volume = "114",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Pergamon Press",

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TY - JOUR

T1 - FEM-aided damage model calibration method for experimental results

AU - Fogsgaard, Martin Bendix

AU - Iannuzzo, Francesco

PY - 2020/11

Y1 - 2020/11

N2 - This paper presents a novel loading evaluation procedure to be used for IGBT power cycling. The method is a combination of experimental life tests and finite element analysis digital twin. It was validated and predicted the life-time with 2.77% error, compared to the 8.78% error of the reference.

AB - This paper presents a novel loading evaluation procedure to be used for IGBT power cycling. The method is a combination of experimental life tests and finite element analysis digital twin. It was validated and predicted the life-time with 2.77% error, compared to the 8.78% error of the reference.

U2 - 10.1016/j.microrel.2020.113915

DO - 10.1016/j.microrel.2020.113915

M3 - Journal article

SN - 0026-2714

VL - 114

JO - Microelectronics Reliability

JF - Microelectronics Reliability

M1 - 113915

ER -

FEM-aided damage model calibration method for experimental results

Abstract

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