Identification of the Terminal-to-Core Couplings in Filter Inductors by Using Double-Pulse-Test Setup

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

2 Citations (Scopus)

Abstract

In this paper, the capacitive couplings between the terminals and the magnetic core of a medium-voltage (MV) filter inductor are identified by using the double-pulse-test setup under high-voltage and -current excitation, instead of using the traditional impedance analyzer, which performs frequency sweep at low-voltage and -current magnitudes. The time-domain current and voltage waveforms from the double-pulse-test setup are measured and further converted into the frequency-domain signals by using the Fourier Transformation. From this, the terminal-to-core impedance between the inductor terminals and the magnetic core of MV inductors under high-voltage and core saturation is obtained. The calculated impedance by using the measured data from DPT is compared with the measurementsfrom an impedance analyzer, where the result indicates that the high-voltage and -current has almost no impacts on the change of the couplings between the inductor terminals and magnetic core of thestudied MV filter inductors.
Original languageEnglish
Title of host publication2020 IEEE 21st Workshop on Control and Modeling for Power Electronics, COMPEL 2020
PublisherIEEE
Publication dateNov 2020
Pages1-6
Article number9265854
ISBN (Electronic)9781728171609
DOIs
Publication statusPublished - Nov 2020
Event21st IEEE Workshop on Control and Modeling for Power Electronics, COMPEL 2020 - Aalborg, Denmark
Duration: 9 Nov 202012 Nov 2020

Conference

Conference21st IEEE Workshop on Control and Modeling for Power Electronics, COMPEL 2020
Country/TerritoryDenmark
CityAalborg
Period09/11/202012/11/2020
Series2020 IEEE 21st Workshop on Control and Modeling for Power Electronics, COMPEL 2020

Bibliographical note

Publisher Copyright:
© 2020 IEEE.

Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.

Keywords

  • double-pulse-test
  • filter inductors
  • impedance measurement
  • medium-voltage
  • parasitic couplings

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