Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter

Lorenzo Ceccarelli, Haoze Luo, Francesco Iannuzzo

Research output: Contribution to journal › Conference article in Journal › Research › peer-review

16 Citations (Scopus)

235 Downloads (Pure)

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29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Lorenzo Ceccarelli (Participant)
1 Oct 2018 → 5 Oct 2018
Activity: Attending an event › Conference organisation or participation