Mission profile simplification method for reliability analysis of PV converters

Martin Bendix Fogsgaard; Amir Sajjad Bahman; Francesco Iannuzzo; Frede Blaabjerg

doi:10.1016/j.microrel.2022.114651

Mission profile simplification method for reliability analysis of PV converters

Martin Bendix Fogsgaard^*, Amir Sajjad Bahman, Francesco Iannuzzo, Frede Blaabjerg

^*Corresponding author for this work

Research output: Contribution to journal › Journal article › Research › peer-review

3 Citations (Scopus)

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Abstract

This paper presents a simplification method for photovoltaic (PV) mission profiles to be used in reliability modelling. The method is based on the formulation of a shorter, representative mission profile formed using select days from the mission profile. The method is thoroughly explained and is applied to a number of PV mission profiles as a demonstration. Unlike the previously published simplification method from the same authors, this method is applicable to PV profiles from any climate.

The methodology is demonstrated with three applications of the method. The time reduction yielded by the method is useful in enabling simulation sweeps of parameter variation for sensitivity analysis, in finding design values for system lifetime or profitability, and for other analyses.

Original language	English
Article number	114651
Journal	Microelectronics Reliability
Volume	138
Pages (from-to)	1-6
Number of pages	6
ISSN	0026-2714
DOIs	https://doi.org/10.1016/j.microrel.2022.114651
Publication status	Published - Nov 2022

Keywords

Reliability
Mission profile modelling
Reliability analysis
Degradation modelling
PV
Photovoltaic
PV inverter
Mission profile simplification

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10.1016/j.microrel.2022.114651

1-s2.0-S0026271422001755-mainFinal published version, 3.42 MBLicence: CC BY 4.0

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title = "Mission profile simplification method for reliability analysis of PV converters",

abstract = "This paper presents a simplification method for photovoltaic (PV) mission profiles to be used in reliability modelling. The method is based on the formulation of a shorter, representative mission profile formed using select days from the mission profile. The method is thoroughly explained and is applied to a number of PV mission profiles as a demonstration. Unlike the previously published simplification method from the same authors, this method is applicable to PV profiles from any climate.The methodology is demonstrated with three applications of the method. The time reduction yielded by the method is useful in enabling simulation sweeps of parameter variation for sensitivity analysis, in finding design values for system lifetime or profitability, and for other analyses.",

keywords = "Reliability, Mission profile modelling, Reliability analysis, Degradation modelling, PV, Photovoltaic, PV inverter, Mission profile simplification",

author = "Fogsgaard, {Martin Bendix} and Bahman, {Amir Sajjad} and Francesco Iannuzzo and Frede Blaabjerg",

year = "2022",

month = nov,

doi = "10.1016/j.microrel.2022.114651",

language = "English",

volume = "138",

pages = "1--6",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Pergamon Press",

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T1 - Mission profile simplification method for reliability analysis of PV converters

AU - Fogsgaard, Martin Bendix

AU - Bahman, Amir Sajjad

AU - Iannuzzo, Francesco

AU - Blaabjerg, Frede

PY - 2022/11

Y1 - 2022/11

N2 - This paper presents a simplification method for photovoltaic (PV) mission profiles to be used in reliability modelling. The method is based on the formulation of a shorter, representative mission profile formed using select days from the mission profile. The method is thoroughly explained and is applied to a number of PV mission profiles as a demonstration. Unlike the previously published simplification method from the same authors, this method is applicable to PV profiles from any climate.The methodology is demonstrated with three applications of the method. The time reduction yielded by the method is useful in enabling simulation sweeps of parameter variation for sensitivity analysis, in finding design values for system lifetime or profitability, and for other analyses.

AB - This paper presents a simplification method for photovoltaic (PV) mission profiles to be used in reliability modelling. The method is based on the formulation of a shorter, representative mission profile formed using select days from the mission profile. The method is thoroughly explained and is applied to a number of PV mission profiles as a demonstration. Unlike the previously published simplification method from the same authors, this method is applicable to PV profiles from any climate.The methodology is demonstrated with three applications of the method. The time reduction yielded by the method is useful in enabling simulation sweeps of parameter variation for sensitivity analysis, in finding design values for system lifetime or profitability, and for other analyses.

KW - Reliability

KW - Mission profile modelling

KW - Reliability analysis

KW - Degradation modelling

KW - PV

KW - Photovoltaic

KW - PV inverter

KW - Mission profile simplification

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U2 - 10.1016/j.microrel.2022.114651

DO - 10.1016/j.microrel.2022.114651

M3 - Journal article

SN - 0026-2714

VL - 138

SP - 1

EP - 6

JO - Microelectronics Reliability

JF - Microelectronics Reliability

M1 - 114651

ER -

Mission profile simplification method for reliability analysis of PV converters

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