Vce as early indicator of IGBT module failure mode

Kristian Bonderup Pedersen, Peter Kjær Kristensen, Kjeld Pedersen, Christian Uhrenfeldt, Stig Munk-Nielsen

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

20 Citations (Scopus)
Original languageEnglish
Title of host publication2017 IEEE International Reliability Physics Symposium (IRPS)
Number of pages6
PublisherIEEE
Publication date1 Jun 2017
Article numberFA-1
ISBN (Electronic)978-1-5090-6641-4
DOIs
Publication statusPublished - 1 Jun 2017
EventThe 2017 International Reliability Physics Symposium - Monterey, United States
Duration: 2 Apr 20176 Apr 2017
http://irps.org/

Conference

ConferenceThe 2017 International Reliability Physics Symposium
Country/TerritoryUnited States
CityMonterey
Period02/04/201706/04/2017
Internet address

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