Projekter pr. år
Abstract
We analyze the degradation of multi-crystalline silicon photovoltaic modules undergoing simultaneous thermal, mechanical, and humidity-freeze stress testing to develop a dark environmental chamber in-situ measurement procedure for determining module power loss. We analyze dark I-V curves measured on modules undergoing degradation in three steps; first for shunting and recombination losses; second, series resistance and lifetime losses; and finally, other losses including short circuit current, current mismatch losses associated with a decrease in photo-current generation by removal of some cell areas due to cell fractures, and the additional series resistance losses observed under illumination. Based on the analysis, we propose an in-situ module power loss monitoring procedure that relies on dark current-voltage measurements taken during the stress test and initial and final module flash testing to determine the power degradation characteristic of the module.
Originalsprog | Engelsk |
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Publikationsdato | jul. 2015 |
Antal sider | 5 |
Status | Udgivet - jul. 2015 |
Begivenhed | Workshop on Crystalline Silicon Solar Cells and Modules: Materials and Processes - Colorado, Keystone, USA Varighed: 26 jul. 2015 → 29 jul. 2015 |
Workshop
Workshop | Workshop on Crystalline Silicon Solar Cells and Modules: Materials and Processes |
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Lokation | Colorado |
Land/Område | USA |
By | Keystone |
Periode | 26/07/2015 → 29/07/2015 |
Fingeraftryk
Dyk ned i forskningsemnerne om 'In-Situ Measurement of Power Loss for Crystalline Silicon Modules Undergoing Thermal Cycling and Mechanical Loading Stress Testing'. Sammen danner de et unikt fingeraftryk.Projekter
- 1 Afsluttet
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SPVSYS: Smart Photovoltaic Systems
Teodorescu, R., Séra, D., Kerekes, T., Borup, U., Spataru, S. V. & Bogdan, C.
01/01/2011 → 31/07/2015
Projekter: Projekt › Forskning