NodeSig: Binary Node Embeddings via Random Walk Diffusion

Abdulkadir Celikkanat, Fragkiskos D. Malliaros, Apostolos N. Papadopoulos

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1 Citationer (Scopus)

Abstract

Graph Representation Learning (GRL) has become a key paradigm in network analysis, with a plethora of interdis-ciplinary applications. As the scale of networks increases, most of the widely used learning-based graph representation models also face computational challenges. While there is a recent effort toward designing algorithms that solely deal with scalability issues, most of them behave poorly in terms of accuracy on downstream tasks. In this paper, we aim to study models that balance the trade-off between efficiency and accuracy. In particular, we propose Nodesig, a scalable model that computes binary node representations. Nodesig exploits random walk diffusion probabilities via stable random projections towards efficiently computing embeddings in the Hamming space. Our extensive experimental evaluation on various networks has demonstrated that the proposed model achieves a good balance between accuracy and efficiency compared to well-known baseline models on the node classification and link prediction tasks.

OriginalsprogEngelsk
TitelProceedings of the 2022 IEEE/ACM International Conference on Advances in Social Networks Analysis and Mining, ASONAM 2022
RedaktørerJisun An, Chelmis Charalampos, Walid Magdy
Antal sider8
ForlagIEEE Signal Processing Society
Publikationsdato2022
Sider68-75
ISBN (Elektronisk)9781665456616
DOI
StatusUdgivet - 2022
Udgivet eksterntJa
Begivenhed14th IEEE/ACM International Conference on Advances in Social Networks Analysis and Mining, ASONAM 2022 - Virtual, Online, Tyrkiet
Varighed: 10 nov. 202213 nov. 2022

Konference

Konference14th IEEE/ACM International Conference on Advances in Social Networks Analysis and Mining, ASONAM 2022
Land/OmrådeTyrkiet
ByVirtual, Online
Periode10/11/202213/11/2022
NavnProceedings of the 2022 IEEE/ACM International Conference on Advances in Social Networks Analysis and Mining, ASONAM 2022

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Publisher Copyright:
© 2022 IEEE.

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