Quantifying Solar Cell Cracks in Photovoltaic Modules by Electroluminescence Imaging

Sergiu Spataru; Peter Hacke; Dezso Sera; Stephen Glick; Tamas Kerekes; Remus Teodorescu

doi:10.1109/PVSC.2015.7356124

Quantifying Solar Cell Cracks in Photovoltaic Modules by Electroluminescence Imaging

Sergiu Spataru, Peter Hacke, Dezso Sera, Stephen Glick, Tamas Kerekes, Remus Teodorescu

AAU Energi

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

31 Citationer (Scopus)

Abstract

This article proposes a method for quantifying the percentage of partially and totally disconnected solar cell cracks by analyzing electroluminescence images of the photovoltaic module taken under high- and low-current forward bias. The method is based on the analysis of the module’s electroluminescence intensity distribution, applied at module and cell level. These concepts are demonstrated on a crystalline silicon photovoltaic module that was subjected to several rounds of mechanical loading and humidity-freeze cycling, causing increasing levels of solar cell cracks. The proposed method can be used as a diagnostic tool to rate cell damage or quality of modules after transportation. Moreover, the method can be automated and used in quality control for module manufacturers, installers, or as a diagnostic tool by plant operators and diagnostic service providers.

Originalsprog	Engelsk
Titel	Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
Antal sider	6
Forlag	IEEE Press
Publikationsdato	jun. 2015
Sider	1-6
ISBN (Elektronisk)	978-1-4799-79 44-8
DOI	https://doi.org/10.1109/PVSC.2015.7356124
Status	Udgivet - jun. 2015
Begivenhed	42nd IEEE Photovoltaic Specialists Conference - New Orleans, LA, USA Varighed: 14 jun. 2015 → 19 jun. 2015 Konferencens nummer: 42

Konference

Konference	42nd IEEE Photovoltaic Specialists Conference
Nummer	42
Land/Område	USA
By	New Orleans, LA
Periode	14/06/2015 → 19/06/2015

Navn	I E E E Photovoltaic Specialists Conference. Conference Record
Vol/bind	42
ISSN	0160-8371

Adgang til dokumentet

10.1109/PVSC.2015.7356124

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SPVSYS: Smart Photovoltaic Systems
Teodorescu, R., Séra, D., Kerekes, T., Borup, U., Spataru, S. V. & Bogdan, C.
ForskEL
01/01/2011 → 31/07/2015
Projekter: Projekt › Forskning

Citationsformater

@inproceedings{c2fda4235b124e56a359685f1a67970f,

title = "Quantifying Solar Cell Cracks in Photovoltaic Modules by Electroluminescence Imaging",

abstract = "This article proposes a method for quantifying the percentage of partially and totally disconnected solar cell cracks by analyzing electroluminescence images of the photovoltaic module taken under high- and low-current forward bias. The method is based on the analysis of the module{\textquoteright}s electroluminescence intensity distribution, applied at module and cell level. These concepts are demonstrated on a crystalline silicon photovoltaic module that was subjected to several rounds of mechanical loading and humidity-freeze cycling, causing increasing levels of solar cell cracks. The proposed method can be used as a diagnostic tool to rate cell damage or quality of modules after transportation. Moreover, the method can be automated and used in quality control for module manufacturers, installers, or as a diagnostic tool by plant operators and diagnostic service providers. ",

keywords = "Crystalline silicon, Cell cracks, Diagnosis, Electroluminescence, Photovoltaic modules",

author = "Sergiu Spataru and Peter Hacke and Dezso Sera and Stephen Glick and Tamas Kerekes and Remus Teodorescu",

year = "2015",

month = jun,

doi = "10.1109/PVSC.2015.7356124",

language = "English",

series = "I E E E Photovoltaic Specialists Conference. Conference Record",

publisher = "IEEE Press",

pages = "1--6",

booktitle = "Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)",

note = "42nd IEEE Photovoltaic Specialists Conference, 42nd IEEE PVSC ; Conference date: 14-06-2015 Through 19-06-2015",

}

Spataru, S, Hacke, P, Sera, D, Glick, S, Kerekes, T & Teodorescu, R 2015, Quantifying Solar Cell Cracks in Photovoltaic Modules by Electroluminescence Imaging. i Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC). IEEE Press, I E E E Photovoltaic Specialists Conference. Conference Record, bind 42, s. 1-6, 42nd IEEE Photovoltaic Specialists Conference, New Orleans, LA, USA, 14/06/2015. https://doi.org/10.1109/PVSC.2015.7356124

Quantifying Solar Cell Cracks in Photovoltaic Modules by Electroluminescence Imaging. / Spataru, Sergiu; Hacke, Peter; Sera, Dezso et al.
Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC). IEEE Press, 2015. s. 1-6 (I E E E Photovoltaic Specialists Conference. Conference Record, Bind 42).

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

TY - GEN

T1 - Quantifying Solar Cell Cracks in Photovoltaic Modules by Electroluminescence Imaging

AU - Spataru, Sergiu

AU - Hacke, Peter

AU - Sera, Dezso

AU - Glick, Stephen

AU - Kerekes, Tamas

AU - Teodorescu, Remus

N1 - Conference code: 42

PY - 2015/6

Y1 - 2015/6

N2 - This article proposes a method for quantifying the percentage of partially and totally disconnected solar cell cracks by analyzing electroluminescence images of the photovoltaic module taken under high- and low-current forward bias. The method is based on the analysis of the module’s electroluminescence intensity distribution, applied at module and cell level. These concepts are demonstrated on a crystalline silicon photovoltaic module that was subjected to several rounds of mechanical loading and humidity-freeze cycling, causing increasing levels of solar cell cracks. The proposed method can be used as a diagnostic tool to rate cell damage or quality of modules after transportation. Moreover, the method can be automated and used in quality control for module manufacturers, installers, or as a diagnostic tool by plant operators and diagnostic service providers.

AB - This article proposes a method for quantifying the percentage of partially and totally disconnected solar cell cracks by analyzing electroluminescence images of the photovoltaic module taken under high- and low-current forward bias. The method is based on the analysis of the module’s electroluminescence intensity distribution, applied at module and cell level. These concepts are demonstrated on a crystalline silicon photovoltaic module that was subjected to several rounds of mechanical loading and humidity-freeze cycling, causing increasing levels of solar cell cracks. The proposed method can be used as a diagnostic tool to rate cell damage or quality of modules after transportation. Moreover, the method can be automated and used in quality control for module manufacturers, installers, or as a diagnostic tool by plant operators and diagnostic service providers.

KW - Crystalline silicon

KW - Cell cracks

KW - Diagnosis

KW - Electroluminescence

KW - Photovoltaic modules

U2 - 10.1109/PVSC.2015.7356124

DO - 10.1109/PVSC.2015.7356124

M3 - Article in proceeding

T3 - I E E E Photovoltaic Specialists Conference. Conference Record

SP - 1

EP - 6

BT - Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)

PB - IEEE Press

T2 - 42nd IEEE Photovoltaic Specialists Conference

Y2 - 14 June 2015 through 19 June 2015

ER -

Quantifying Solar Cell Cracks in Photovoltaic Modules by Electroluminescence Imaging

Abstract

Konference

Adgang til dokumentet

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Projekter

SPVSYS: Smart Photovoltaic Systems

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