Engineering
Ability Testing
10%
Absolute Value
32%
Aluminum Electrolytic Capacitor
64%
Analytical Model
16%
Calibration Curve
6%
Change Rate
32%
Component Condition Monitoring
10%
Condition Monitoring
17%
Contact Area
16%
Crack Propagation
32%
Drain Voltage
64%
Dynamic Performance
17%
Experimental Result
42%
Failure Condition
10%
Failure Mechanism
37%
Figure of Merit
32%
Filtration
32%
Finite Volume Method
6%
Fracture Mechanics
16%
Gate Voltage
17%
Hot Spot
10%
Illustrates
10%
Injection Unit
32%
Insulated Gate Bipolar Transistor
96%
Internal Pressure
6%
Junction Temperature
21%
Limitations
17%
Metal-Oxide-Semiconductor Field-Effect Transistor
96%
Metallizations
32%
Negligible Effect
10%
Parameter Data
10%
Power Converter
42%
Power Supply
10%
Proof-of-Concept
10%
Railway
21%
Revealed Failure
16%
Saturation State
32%
Series Resistance
10%
Strain Sensing
32%
Stress Model
10%
Structure Information
10%
Test Condition
16%
Test Method
10%
Testing Condition
6%
Thermal Characterization
64%
Thermal Stress
10%
Transients
79%
Voltage Drop
32%
Wind Power
10%
Zener Diode
32%
Keyphrases
Absolute Value
10%
AC Current
10%
AC Filter
32%
AC-AC
10%
Accelerated Degradation Test
32%
Analytical Analysis
10%
Capacitance Value
10%
Comprehensive Investigation
10%
Condition Monitoring
10%
Current-voltage
21%
Cycles to Failure
42%
Degradation Failure
32%
Degradation Testing
10%
Drain Voltage
32%
Dynamic Performance
10%
End-of-life Criteria
32%
Failure Mechanism
10%
Failure Mechanism Analysis
10%
Failure Phenomena
32%
Film Capacitor
32%
Gate Voltage
10%
Gradient-based
32%
Hardware Algorithm
10%
Heating Current
18%
Injection Unit
32%
Insulated Gate Bipolar Transistors
10%
Insulation Resistance
32%
Multi-conditions
10%
MW Power
10%
Physics Understanding
10%
Power Converter
10%
Power Cycling Test
10%
Power Semiconductor Module
32%
Power-off
32%
Silicon Carbide (SiC) MOSFET
64%
Silicon Carbide Devices
17%
Silicon Semiconductor
10%
Static Performance
10%
Structure Information
10%
Testing Mechanism
10%
Testing Parameters
10%
Testing Sample
21%
Thermal Characterization
32%
Thermal Parameters
10%
Thermal Properties
10%
Thermal Structure
19%
Thermal Transient Measurement
85%
Thermo-sensitive Electrical Parameter
23%
Transient Measurement Method
14%
Zener Diode
32%
Material Science
Aluminum
64%
Bipolar Transistor
96%
Capacitance
18%
Capacitor
100%
Contact Area
10%
Contact Resistance
10%
Crack Propagation
21%
Electrical Resistivity
32%
Electrochemical Reaction
5%
Electronic Circuit
38%
Film
32%
Fracture Mechanics
10%
Metal-Oxide-Semiconductor Field-Effect Transistor
96%
Semiconductor Device
6%
Silicon
14%
Silicon Carbide
64%
Thermal Analysis
32%
Thermal Property
14%
Thermal Stress
10%