TY - JOUR
T1 - A Robust Testing Method for DC and AC Capacitors With Minimum Required Power Supply
AU - Bo, Yao
AU - Wang, Qian
AU - Wang, Haoran
AU - Hasegawa, Kazunori
AU - Wang, Huai
PY - 2022/5
Y1 - 2022/5
N2 - This letter proposes a testing method to emulate realistic stress conditions of dc and ac capacitors, with minimum required power supply and robust operation at the presence of capacitor degradation. It is especially suitable for parameter characterization and accelerated degradation testing of high-voltage and high-ripple current power electronic capacitors. The circuit architecture of the proposed testing method and the constraints of the testing samples under given designs are discussed. Proof-of-concept experiments on both dc and ac capacitors verify the feasibility.
AB - This letter proposes a testing method to emulate realistic stress conditions of dc and ac capacitors, with minimum required power supply and robust operation at the presence of capacitor degradation. It is especially suitable for parameter characterization and accelerated degradation testing of high-voltage and high-ripple current power electronic capacitors. The circuit architecture of the proposed testing method and the constraints of the testing samples under given designs are discussed. Proof-of-concept experiments on both dc and ac capacitors verify the feasibility.
UR - https://ieeexplore.ieee.org/document/9625840
U2 - 10.1109/TPEL.2021.3130085
DO - 10.1109/TPEL.2021.3130085
M3 - Journal article
SN - 0885-8993
VL - 37
SP - 4942
EP - 4946
JO - I E E E Transactions on Power Electronics
JF - I E E E Transactions on Power Electronics
IS - 5
ER -