Engineering
Power Device
100%
Power Loss
100%
Computational Efficiency
100%
Power Electronics
100%
Reliability Evaluation
50%
Fundamental Frequency
50%
Modeling Error
50%
Junction Temperature
50%
Insulated Gate Bipolar Transistor
50%
Thermal Stress Analysis
50%
Semiconductor Device
50%
Analytical Model
50%
Computer Science
Electronic System
100%
Computational Efficiency
100%
Estimation Accuracy
50%
Efficient Computation
50%
Modeling Error
50%
Analytical Model
50%
Fundamental Frequency
50%
Material Science
Power Device
100%
Semiconductor Device
50%
Thermal Analysis
50%
Stress Analysis
50%
Bipolar Transistor
50%
Thermal Stress
50%
Keyphrases
Simplification Method
100%
Quantitative Error Analysis
100%
Thermal Estimation
66%