Approaching Repetitive Short Circuit Tests on MW-Scale Power Modules by means of an Automatic Testing Setup

Paula Diaz Reigosa; Huai Wang; Francesco Iannuzzo; Frede Blaabjerg

doi:10.1109/ECCE.2016.7854884

Approaching Repetitive Short Circuit Tests on MW-Scale Power Modules by means of an Automatic Testing Setup

Paula Diaz Reigosa, Huai Wang, Francesco Iannuzzo, Frede Blaabjerg

AAU Energy

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

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Abstract

An automatic testing system to perform repetitive short-circuit tests on megawatt-scale IGBT power modules is pre-sented and described in this paper, pointing out the advantages and features of such testing approach. The developed system is based on a non-destructive short-circuit tester, which has been integrated with an advanced software tool and a semiconductor device analyzer to perform stress monitoring on the considered device under test (DUT). A case-study is included in the paper concerning a 1.7 kV/ 1 kA IGBT module, which has been tested safely up to 30,000 repetitions with no signiﬁcant damage. The developed system has been demonstrated to be very helpful in performing a large number of repetition tests as required by modern testing protocols for robustness and reliability assess-ment. The software algorithm and a demonstration video are available for download.

Original language	English
Title of host publication	Proceedings of 8th IEEE Energy Conversion Congress and Exposition (ECCE), 2016
Number of pages	8
Publisher	IEEE Press
Publication date	Sept 2016
ISBN (Electronic)	978-1-5090-0737-0
DOIs	https://doi.org/10.1109/ECCE.2016.7854884
Publication status	Published - Sept 2016
Event	8th Annual IEEE Energy Conversion Congress & Exposition: ECCE 2016 - Milwaukee, WI, United States Duration: 18 Sept 2016 → 22 Sept 2016 http://www.ieee-ecce.org/

Conference

Conference	8th Annual IEEE Energy Conversion Congress & Exposition
Country/Territory	United States
City	Milwaukee, WI
Period	18/09/2016 → 22/09/2016
Sponsor	IEEE, IEEE Industry Applications Society (IAS), IEEE Power Electronics and Industry Applications Societies (PELS)
Internet address	http://www.ieee-ecce.org/

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10.1109/ECCE.2016.7854884

2016_Reigosa_ECCEAccepted author manuscript, 8.17 MB

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@inproceedings{8f6f24031179448aadb1404ee3af0117,

title = "Approaching Repetitive Short Circuit Tests on MW-Scale Power Modules by means of an Automatic Testing Setup",

abstract = "An automatic testing system to perform repetitive short-circuit tests on megawatt-scale IGBT power modules is pre-sented and described in this paper, pointing out the advantages and features of such testing approach. The developed system is based on a non-destructive short-circuit tester, which has been integrated with an advanced software tool and a semiconductor device analyzer to perform stress monitoring on the considered device under test (DUT). A case-study is included in the paper concerning a 1.7 kV/ 1 kA IGBT module, which has been tested safely up to 30,000 repetitions with no signiﬁcant damage. The developed system has been demonstrated to be very helpful in performing a large number of repetition tests as required by modern testing protocols for robustness and reliability assess-ment. The software algorithm and a demonstration video are available for download.",

author = "Reigosa, {Paula Diaz} and Huai Wang and Francesco Iannuzzo and Frede Blaabjerg",

year = "2016",

month = sep,

doi = "10.1109/ECCE.2016.7854884",

language = "English",

booktitle = "Proceedings of 8th IEEE Energy Conversion Congress and Exposition (ECCE), 2016",

publisher = "IEEE Press",

note = " 8th Annual IEEE Energy Conversion Congress & Exposition : ECCE 2016, ECCE 2016 ; Conference date: 18-09-2016 Through 22-09-2016",

url = "http://www.ieee-ecce.org/",

}

Reigosa, PD, Wang, H , Iannuzzo, F & Blaabjerg, F 2016, Approaching Repetitive Short Circuit Tests on MW-Scale Power Modules by means of an Automatic Testing Setup. in Proceedings of 8th IEEE Energy Conversion Congress and Exposition (ECCE), 2016. IEEE Press, 8th Annual IEEE Energy Conversion Congress & Exposition, Milwaukee, WI, United States, 18/09/2016. https://doi.org/10.1109/ECCE.2016.7854884

Approaching Repetitive Short Circuit Tests on MW-Scale Power Modules by means of an Automatic Testing Setup. / Reigosa, Paula Diaz; Wang, Huai ; Iannuzzo, Francesco et al.
Proceedings of 8th IEEE Energy Conversion Congress and Exposition (ECCE), 2016. IEEE Press, 2016.

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

TY - GEN

T1 - Approaching Repetitive Short Circuit Tests on MW-Scale Power Modules by means of an Automatic Testing Setup

AU - Reigosa, Paula Diaz

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AU - Iannuzzo, Francesco

AU - Blaabjerg, Frede

PY - 2016/9

Y1 - 2016/9

N2 - An automatic testing system to perform repetitive short-circuit tests on megawatt-scale IGBT power modules is pre-sented and described in this paper, pointing out the advantages and features of such testing approach. The developed system is based on a non-destructive short-circuit tester, which has been integrated with an advanced software tool and a semiconductor device analyzer to perform stress monitoring on the considered device under test (DUT). A case-study is included in the paper concerning a 1.7 kV/ 1 kA IGBT module, which has been tested safely up to 30,000 repetitions with no signiﬁcant damage. The developed system has been demonstrated to be very helpful in performing a large number of repetition tests as required by modern testing protocols for robustness and reliability assess-ment. The software algorithm and a demonstration video are available for download.

AB - An automatic testing system to perform repetitive short-circuit tests on megawatt-scale IGBT power modules is pre-sented and described in this paper, pointing out the advantages and features of such testing approach. The developed system is based on a non-destructive short-circuit tester, which has been integrated with an advanced software tool and a semiconductor device analyzer to perform stress monitoring on the considered device under test (DUT). A case-study is included in the paper concerning a 1.7 kV/ 1 kA IGBT module, which has been tested safely up to 30,000 repetitions with no signiﬁcant damage. The developed system has been demonstrated to be very helpful in performing a large number of repetition tests as required by modern testing protocols for robustness and reliability assess-ment. The software algorithm and a demonstration video are available for download.

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DO - 10.1109/ECCE.2016.7854884

M3 - Article in proceeding

BT - Proceedings of 8th IEEE Energy Conversion Congress and Exposition (ECCE), 2016

PB - IEEE Press

T2 - 8th Annual IEEE Energy Conversion Congress & Exposition

Y2 - 18 September 2016 through 22 September 2016

ER -

Approaching Repetitive Short Circuit Tests on MW-Scale Power Modules by means of an Automatic Testing Setup

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