De-Embedding of On-Wafer Noise Measurements

Christian Rye Iversen

Research output: Book/Report › Book › Research

Original language	English

Place of Publication	Aalborg
Publisher	Aalborg Universitetsforlag
Publication status	Published - 2000

Series	Aalborg Universitetscenter. Institut for Elektroniske Systemer. Afdeling for Kommunikationsteknologi. Rapport
Number	R2000-1005
ISSN	0908-1224

AUB Link

@book{81eb6230003311dab4d5000ea68e967b,

title = "De-Embedding of On-Wafer Noise Measurements",

author = "Iversen, {Christian Rye}",

year = "2000",

language = "English",

series = "Aalborg Universitetscenter. Institut for Elektroniske Systemer. Afdeling for Kommunikationsteknologi. Rapport",

number = "R2000-1005",

publisher = "Aalborg Universitetsforlag",

}