TY - JOUR
T1 - High performance, FPGA-based test apparatus for unclamped inductive switching of IGBTs
AU - Iannuzzo, F.
PY - 2008/8/1
Y1 - 2008/8/1
N2 - A new concept for testing of power devices, in particular IGBTs, under unclamped inductive switching (UIS) conditions has been adopted and presented in this paper. The testing apparatus is completely FPGA-based and is capable of setting each time of the test (especially the protection one) with a precision of 20 ns. Furthermore, the FPGA embeds a microprocessor, which is responsible for the complete control of the apparatus by a personal computer. Fourth- and fifth-generation, low- and medium-voltage IGBTs have been tested thanks to the presented apparatus, and the collected results have been presented, evidencing significant behavioural differences between the two technologies.
AB - A new concept for testing of power devices, in particular IGBTs, under unclamped inductive switching (UIS) conditions has been adopted and presented in this paper. The testing apparatus is completely FPGA-based and is capable of setting each time of the test (especially the protection one) with a precision of 20 ns. Furthermore, the FPGA embeds a microprocessor, which is responsible for the complete control of the apparatus by a personal computer. Fourth- and fifth-generation, low- and medium-voltage IGBTs have been tested thanks to the presented apparatus, and the collected results have been presented, evidencing significant behavioural differences between the two technologies.
UR - http://www.scopus.com/inward/record.url?scp=50249121906&partnerID=8YFLogxK
U2 - 10.1016/j.microrel.2008.07.025
DO - 10.1016/j.microrel.2008.07.025
M3 - Journal article
AN - SCOPUS:50249121906
SN - 0026-2714
VL - 48
SP - 1449
EP - 1452
JO - Microelectronics Reliability
JF - Microelectronics Reliability
IS - 8-9
ER -