TY - GEN
T1 - A Stress Emulation Method for Concurrent Testing of AC and DC Capacitors
AU - Yao, Bo
AU - Wang, Haoran
AU - Wang, Huai
PY - 2022/5
Y1 - 2022/5
N2 - This paper proposes a capacitor testing method that can concurrently emulate the electrical stresses of both AC and DC capacitors for high-power converter applications. It preserves the advantages of a recently reported method with a minimum required power sup-plies and is robust to testing sample degradation, which, however, limits to test either AC or DC capacitors. The circuit architecture and application examples are presented. Experimental results verify the feasibility and effectiveness of the proposed testing method.
AB - This paper proposes a capacitor testing method that can concurrently emulate the electrical stresses of both AC and DC capacitors for high-power converter applications. It preserves the advantages of a recently reported method with a minimum required power sup-plies and is robust to testing sample degradation, which, however, limits to test either AC or DC capacitors. The circuit architecture and application examples are presented. Experimental results verify the feasibility and effectiveness of the proposed testing method.
UR - https://ieeexplore.ieee.org/document/9807254
U2 - 10.23919/IPEC-Himeji2022-ECCE53331.2022.9807254
DO - 10.23919/IPEC-Himeji2022-ECCE53331.2022.9807254
M3 - Article in proceeding
BT - 2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia)
ER -