Abstract
In this article, the distributed-press-pack (DPP) packaging technology is developed to achieve balanced thermal stress on the chips. Under the current lumped-press-pack (LPP) style, the mechanical stress distribution on the chips, which is inherently uneven and coupled with thermal stress distribution, can be described with elastic half-space theoretical model. By decentralizing the lumped pressing load and positioning the loads evenly, a matrix of clamping array is formulated, and the mechanical stress distribution is compared under different clamping ways. Then a 3×3 clamping method that meets the trade-off between the balanced stress distribution and the packaging cost is chosen. Meanwhile, the busbar and heatsinks are integrated to improve the power density of the power module. Finally, a DPP prototype is implemented. By varying the pressure around the chips and heating them, the thermal distribution between parallel chips inside the prototype is compared and the effect of the proposed elastic half-space theory-based DPP packaging technology on the thermal stress balance is verified.
Original language | English |
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Article number | 9078066 |
Journal | IEEE Journal of Emerging and Selected Topics in Power Electronics |
Volume | 9 |
Issue number | 4 |
Pages (from-to) | 3892-3903 |
Number of pages | 12 |
ISSN | 2168-6777 |
DOIs | |
Publication status | Published - Aug 2021 |
Bibliographical note
Funding Information:Manuscript received December 9, 2019; revised February 11, 2020 and March 30, 2020; accepted April 20, 2020. Date of publication April 24, 2020; date of current version July 30, 2021. This work was supported in part by the National Nature Science Foundations of China under Grant 51925702 and Grant 51677166 and in part by the National Key Research and Development Program of China under Grant 2017YFE0112400. Recommended for publication by Associate Editor Jun Wang. (Corresponding author: Haoze Luo.) Yao Chang, Chengmin Li, Wuhua Li, and Xiangning He are with the College of Electrical Engineering, Zhejiang University, Hangzhou 310027, China (e-mail: cy_pe@zju.edu.cn; lichengmin@zju.edu.cn; woohualee@zju.edu.cn; hxn@zju.edu.cn).
Publisher Copyright:
© 2013 IEEE.
Keywords
- Packaging technology
- press-pack
- reliability
- thermal stress