Temperature distribution of 10 kV and 15 kV SiC-MOSFETs with large edge area

Masaki Takahashi^*, Zhongchao Sun, Jannick Kjær Jørgensen, Szymon Beczkowski, Stig Munk-Nielsen, Asger Bjørn Jørgensen

^*Corresponding author for this work

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

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Developing the Novel Reliability Design Method with 3D-simulation of SiC Power Module
Takahashi, M., Uhrenfeldt, C., Munk-Nielsen, S. & Jørgensen, A. B.
01/10/2021 → 30/09/2024
Project: PhD Project
CoDE: Center of Digitalized Electronics (CoDE)
Munk-Nielsen, S., Jørgensen, A. B., Uhrenfeldt, C., Beczkowski, S. M., Ahmad, F., Meinert, J. D., Kubulus, P. P., Takahashi, M., Sun, Z., Wang, R., Gao, Y., Zäch, M. R., Meyer, S. & Steffensen, B.
Poul Due Jensen Foundation
01/01/2021 → 31/12/2025
Project: Research