Comparative Study of State of Charge Estimation Under Different Open Circuit Voltage Test Conditions for Lithium-Ion Batteries

Alejandro Gismero, Daniel-Ioan Stroe, Erik Schaltz

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

1 Citationer (Scopus)
114 Downloads (Pure)

Abstract

The state of charge (SOC) is an essential indicator needed for
a proper and safe operation of a battery. A large majority of
methods used to estimate SOC rely on the open circuit voltage
(OCV) curve. The OCV-SOC relationship is characteristic of the
battery chemistry but it may also be affected by the temperature,
aging or even the measurement procedure. In this work, the
effect of these factors on the OCV curve is analyzed and their
influence on the SOC estimation is studied. For this purpose
an extended Kalman filter (EKF) has been used to compare the
SOC estimation performance under different conditions. Also, the
results obtained by two different methods have been compared,
at two different aging states and various temperatures in the
range 5-40C.
OriginalsprogEngelsk
TitelIECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society
Antal sider6
ForlagIEEE
Publikationsdato18 nov. 2020
Sider1767-1772
ISBN (Elektronisk)978-1-7281-5414-5
DOI
StatusUdgivet - 18 nov. 2020
Begivenhed46th Annual Conference of the IEEE Industrial Electronics Society, IECON 2020 - Virtual, Singapore, Singapore
Varighed: 18 okt. 202021 okt. 2020
http://www.conferences.academicjournals.org/cat/physical-sciences/46th-annual-conference-of-the-ieee-industrial-electronics-society

Konference

Konference46th Annual Conference of the IEEE Industrial Electronics Society, IECON 2020
Land/OmrådeSingapore
ByVirtual, Singapore
Periode18/10/202021/10/2020
SponsorIEEE Industrial Electronics Society (IES), SPECS - Smart Grid + Power Electronics Consortium Singapore, The Institute of Electrical and Electronics Engineers (IEEE)
Internetadresse
NavnProceedings of the Annual Conference of the IEEE Industrial Electronics Society
ISSN1553-572X

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