Reliability-Driven Assessment of GaN HEMTs and Si IGBTs in 3L-ANPC PV Inverters

Emre Gurpinar, Yongheng Yang, Francesco Iannuzzo, Alberto Castellazzi, Frede Blaabjerg

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review

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Engineering

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