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Research Output 2008 2019

Conference article in Journal
1 Citation (Scopus)
26 Downloads (Pure)

Investigation of acoustic emission as a non-invasive method for detection of power semiconductor aging

Davari, P., Kristensen, O. D. & Iannuzzo, F., Sep 2018, In : Microelectronics Reliability. 88-90, p. 545-549 5 p.

Research output: Contribution to journalConference article in JournalResearchpeer-review

acoustic emission
Acoustic emissions
Aging of materials
Semiconductor materials
Condition monitoring