A Compact P⁺ Contact Resistance Model for Characterization of Substrate Coupling in Modern Lightly Doped CMOS Processes

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

7 Citations (Scopus)
674 Downloads (Pure)

Abstract

Compact modeling of P+ contact resistances is
important for characterization of substrate noise coupling in
mixed-signal System on Chips (SoCs). Existing contact resistance
models can handle uniformly doped bulk or epitaxial substrates.
However, compact contact resistance models feasible for modern
lightly-doped CMOS processes with P-well layers are still unavailable.
This paper presents a new compact resistance model aiming
at solving this problem. A Conformal Mapping(CM) method was
used to derive the closed-form expressions for the resistances in
the model. The model requires no fitting factors, and it is scalable
to layout/substrate parameters. The proposed model can also be
used to predict noise coupling in terms of S-parameters. The
model validation has been done by both EM simulations and
measurements, and satisfactory agreement is found between the
modeled and measured resistances as well as S-parameters.
Original languageEnglish
Title of host publicationEuropean Microwave Week 2012 Conference Proceedings
PublisherEuMA
Publication date2012
ISBN (Electronic)978-2-87487-028-6
Publication statusPublished - 2012
EventEuropean Microwave Integrated Circuits Conference 2012 - Amsterdam, Netherlands
Duration: 29 Oct 201230 Oct 2012

Conference

ConferenceEuropean Microwave Integrated Circuits Conference 2012
CountryNetherlands
CityAmsterdam
Period29/10/201230/10/2012

Fingerprint Dive into the research topics of 'A Compact P⁺ Contact Resistance Model for Characterization of Substrate Coupling in Modern Lightly Doped CMOS Processes'. Together they form a unique fingerprint.

Cite this