A new test methodology for an exhaustive study of single-event-effects on power MOSFETs

G. Busatto, D. Bisello, G. Curr, P. Giubilato, F. Iannuzzo^*, S. Mattiazzo, D. Pantano, A. Sanseverino, L. Silvestrin, M. Tessaro, F. Velardi, J. Wyss

^*Corresponding author for this work

Research output: Contribution to journal › Journal article › Research › peer-review