Fingerprint
Dive into the research topics of 'Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules
Haoze Luo*, Nick Baker, Francesco Iannuzzo, Frede Blaabjerg
*Corresponding author for this work
Research output: Contribution to journal › Conference article in Journal › Research › peer-review
28
Citations
(Scopus)