Inverter design for future electrified aircraft propulsion systems under consideration of wear-out failure and random failure

Yongtao Cao, Leon Fauth, Ralf Johannes Keuter, Ariya Sangwongwanich, Mateja Novak, Frede Blaabjerg, Bernd Ponick, Axel Mertens

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

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Abstract

To reduce the wear-out effect and minimize the Single Event Burnout effect of the power semiconductor, several hardware design rules for inverters in electric aircraft propulsion systems are posed and implemented in this work. These strategies include scalable chip area and derated DC-link voltage. It is observed in a short-range reference aircraft case study that these rules could result in a conflict of objectives: reducing the risk of wear-out failure while simultaneously minimizing the risk of random failure. Therefore, it is recommended to consider random failures, wear-out failures, and their mutual impacts in a comprehensive analysis of system reliability. A reliability-oriented design rule is proposed in this work.
Original languageEnglish
Title of host publicationProceedings of the 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)
Number of pages10
PublisherIEEE
Publication date2 Oct 2023
Pages1-10
Article number10264306
ISBN (Print)979-8-3503-1678-0
ISBN (Electronic)978-9-0758-1541-2
DOIs
Publication statusPublished - 2 Oct 2023
Event2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) - Aalborg, Denmark
Duration: 4 Sept 20238 Sept 2023

Conference

Conference2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)
Country/TerritoryDenmark
CityAalborg
Period04/09/202308/09/2023

Keywords

  • Analytical models
  • Degradation
  • Lifetime
  • Reliability
  • Semiconductor device modeling
  • electrified aircraft
  • inverter design

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