Engineering
Metal-Oxide-Semiconductor Field-Effect Transistor
100%
Insulated Gate Bipolar Transistor
42%
Junction Temperature
41%
Power Device
25%
Experimental Result
21%
Power Electronics
20%
Thermal Stress
18%
Power Converter
16%
Photovoltaics
15%
Short Circuit Condition
15%
Failure Mechanism
15%
Reliability Analysis
14%
Experimental Characterization
14%
Finite Element Method
12%
Condition Monitoring
12%
Simulation Result
12%
Transients
12%
Energy Engineering
11%
Operating Area
10%
Thermal Model
10%
Internals
10%
Circuit Test
9%
Semiconductor Device
9%
Mechanical Stress
9%
Gate Voltage
9%
Voltage Drop
8%
Power Loss
8%
Gate Oxide
8%
Non-Destructive Testing
8%
Temperature Distribution
8%
Energy Dissipation
7%
Test Condition
7%
Electric Field
7%
Temperature Estimation
7%
Switching Frequency
7%
Finite Element Simulation
7%
Failure Analysis
7%
Current Load
6%
Power Supply
6%
SPICE
6%
Single Event Effect
6%
Nitride
6%
Field Programmable Gate Arrays
6%
Bipolar Transistor
6%
Test Method
6%
Experimental Investigation
6%
Current Output
5%
Power Generation
5%
Calorimeter
5%
Power Engineering
5%
Keyphrases
IGBT Module
7%
Bond Wire
7%
Junction Temperature
6%
Photovoltaic Inverter
6%
Mission Profile
6%
SiC MOSFET
5%
Power Module
5%
Junction Temperature Measurement
5%
Power MOSFET
5%
Insulated Gate Bipolar Transistors
5%