TY - JOUR
T1 - A Novel Sensor-Reduction Condition Monitoring Approach for MMC Submodule IGBTs Based on Statistics of Inferred On-State Voltage
AU - Zhan, Cao
AU - Wang, Weicheng
AU - Tang, Yizheng
AU - Li, Yixin
AU - Iannuzzo, Francesco
AU - Zhu, Lingyu
AU - Yu, Kefan
AU - Ji, Shengchang
AU - Blaabjerg, Frede
PY - 2024/2
Y1 - 2024/2
N2 - Condition monitoring (CM) of modular multilevel converters (MMCs) submodule insulated gate bipolar transistors (IGBTs) is of significance to ensure reliable operation. The ON-state voltage of IGBT is a promising indicator to perform CM while its application in MMC is tricky due to high blocking voltage and numerous submodules. In this article, a novel sensor-reduction approach is presented to infer the ON-state voltages of MMC submodule IGBTs. Such an estimation method of the ON-state voltages is based ON Kirchhoff’s voltage law (KVL) applied to an MMC arm. This method focuses on a statistical analysis of capacitor voltages and arm voltages. The switching-state combinations are specifically selected for the purpose. A case study is conducted on a single-phase seven-level MMC test bench to verify the proposed ON-state voltage estimation method, which only shows an error of less than 3%. Furthermore, continuous ON-state voltage estimations are made with this MMC test bench under steady-state operations and carry out statistical analysis of the inferred ON-state voltage at various deterioration levels. Finally, a confusion matrix is proposed, whose maximum accuracy reaches 92.4% for the early-deterioration condition.
AB - Condition monitoring (CM) of modular multilevel converters (MMCs) submodule insulated gate bipolar transistors (IGBTs) is of significance to ensure reliable operation. The ON-state voltage of IGBT is a promising indicator to perform CM while its application in MMC is tricky due to high blocking voltage and numerous submodules. In this article, a novel sensor-reduction approach is presented to infer the ON-state voltages of MMC submodule IGBTs. Such an estimation method of the ON-state voltages is based ON Kirchhoff’s voltage law (KVL) applied to an MMC arm. This method focuses on a statistical analysis of capacitor voltages and arm voltages. The switching-state combinations are specifically selected for the purpose. A case study is conducted on a single-phase seven-level MMC test bench to verify the proposed ON-state voltage estimation method, which only shows an error of less than 3%. Furthermore, continuous ON-state voltage estimations are made with this MMC test bench under steady-state operations and carry out statistical analysis of the inferred ON-state voltage at various deterioration levels. Finally, a confusion matrix is proposed, whose maximum accuracy reaches 92.4% for the early-deterioration condition.
KW - Condition monitoring (CM)
KW - insulated gate bipolar transistor (IGBT)
KW - modular multilevel converter (MMC)
KW - sensor-reduction
KW - text voltage
KW - ON-state voltage
UR - http://www.scopus.com/inward/record.url?scp=85178045787&partnerID=8YFLogxK
U2 - 10.1109/JESTPE.2023.3334643
DO - 10.1109/JESTPE.2023.3334643
M3 - Journal article
SN - 2168-6777
VL - 12
SP - 1068
EP - 1077
JO - I E E E Journal of Emerging and Selected Topics in Power Electronics
JF - I E E E Journal of Emerging and Selected Topics in Power Electronics
IS - 1
M1 - 10323077
ER -