Deflectometric data segmentation based on fully convolutional neural networks

Daniel Maestro-Watson*, Julen Balzategui, Luka Eciolaza, Nestor Arana-Arexolaleiba

*Kontaktforfatter

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

4 Citationer (Scopus)

Abstract

The purpose of this paper is to explore the use of Fully Convolutional Neural Networks (FCN) to perform a semantic segmentation of deflectometric recordings for quality control of reflective surfaces. The proposed method relies on a U-Net network to identify the location and boundaries of the object, and the possible defective areas present, by performing a pixel-wise classification based on local curvatures and data modulation. Experiments performed on a real industrial problem demonstrate that the combination of geometric and photometric information enables the identification of a wider variety of shape and texture imperfections, with predictions closely correlated with the visual impact of the defects. The research also highlights the relevance of the labeling process and human inspection limits, and suggestions are presented for a near-Term industrial utilization.

OriginalsprogEngelsk
TitelFourteenth International Conference on Quality Control by Artificial Vision
RedaktørerChristophe Cudel, Stephane Bazeille, Nicolas Verrier
ForlagSPIE - International Society for Optical Engineering
Publikationsdato2019
Artikelnummer1117209
ISBN (Elektronisk)9781510630536
DOI
StatusUdgivet - 2019
Begivenhed14th International Conference on Quality Control by Artificial Vision, QCAV 2019 - Mulhouse, Frankrig
Varighed: 15 maj 201917 maj 2019

Konference

Konference14th International Conference on Quality Control by Artificial Vision, QCAV 2019
Land/OmrådeFrankrig
ByMulhouse
Periode15/05/201917/05/2019
SponsorIDS GmbH, Mulhouse Alsace Agglomeration, Region Grand-Est
NavnProceedings of SPIE - The International Society for Optical Engineering
Vol/bind11172
ISSN0277-786X

Bibliografisk note

Publisher Copyright:
© 2019 SPIE.

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