A Mitigation Strategy for the Short-Circuit Degradation in SiC MOSFETs

He Du, Francesco Iannuzzo

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

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2020

Impact of Short-Circuit Events on the Remaining Useful Life of SiC MOSFETs and Mitigation Strategy
Du, H., 2020, Aalborg Universitetsforlag. 83 s.
Publikation: Ph.d.-afhandling

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